High Power Pulse Instruments GmbH – Advanced TLP/HMM/HBM Solutions

ATS-8000A Automated Test System

Fully automated test and probing solution for HBM, TLP, HMM and CC-TLP on package- and wafer-level.

TLP-8010C Advanced

80A VF-TLP/TLP, 15kV HMM plus optional 6kV HBM (JEDEC) system. Optional pulse width extender TLP-3011C, TLP-8012A5

6kV HBM Extension for TLP

80A VF-TLP/TLP + 15kV HMM + 6kV HBM (JEDEC)

TLP-3010C

30A TLP/VF-TLP/HMM test system TLP-3010C: shown with optional pulse width extender TLP-3011C

Accessories

Including all required accessories for VF-TLP/TLP/HMM/HBM

PS-5026B

Low Cost Portable Wafer Probe Station for TLP/VF-TLP/HMM/HBM

Flexible Pitch GND Fixture GF-A

High performance GND clamps for flex-pitch application

Accurate Calibration

High performance wafer-level calibration substrate for accurate calibration of the VF-TLP/TLP/HMM/HBM system.

ATS-8000A Automated Test System

The ATS-8000A test system is a fully automated 2-pin probing solution for HBM, TLP, HMM and CC-TLP on package- and wafer-level. Future extension for CDM is optional.

CC-TLP

HPPI is offering CC-TLP for investigation of CDM from Fraunhofer EMFT. The new CC-TLP probe CC-TLP-50-A1 is operated using the HPPI TLP-3010C/4010C/8010C systems and software.

What is TLP?

High Current TLP Characterisation: An Effective Tool for the Development of Semiconductor Devices and ESD Protection Solutions

HBM-S1-B: ±6 kV HBM Extension for TLP

±6 kV Human-Body-Model 2-pin tester according ANSI/ESDA/JEDEC JS-001.

PHD-4001A: High Performance VF-TLP/TLP/HMM Probearm Kit

Extremely compact and robust TLP/VF-TLP/HMM Picoprobe probearm kit for temperature measurements using coaxial cable tunnels for thermo-chuck in isolated chamber temperature measurements for 300 mm probe stations.

CS-0V5-A: 100 A in 150 ps

Pulse current sensor CS-0V5-A with very fast rise time <150 ps up to 100 A. Sensitivity 0.5 V/A at >3 GHz bandwidth. Successor for Tek CT-1/2/6.