The ATS-8000A test system is a fully automated 2-pin probing solution for HBM, TLP, HMM and CC-TLP on package- and wafer-level.
Future extension for CDM is optional.
HPPI is offering CC-TLP for investigation of CDM from Fraunhofer EMFT. The new CC-TLP probe CC-TLP-50-A1 is operated using the HPPI TLP-3010C/4010C/8010C/12010C systems and software.
High Current TLP Characterisation: An Effective Tool for the Development of Semiconductor Devices and ESD Protection Solutions
±6 kV Human-Body-Model 2-pin tester according ANSI/ESDA/JEDEC JS-001.
Extremely compact and robust TLP/VF-TLP/HMM Picoprobe probearm kit for temperature measurements using coaxial cable tunnels for thermo-chuck in isolated chamber temperature measurements for 300 mm probe stations.
Pulse current sensor CS-0V5-A with very fast rise time 3 GHz bandwidth. Successor for Tek CT-1/2/6.
New range extension of TLP-xx10C systems up to 120 A and 32 kV HMM.
New precision wafer-level calibration ceramic substrate for VF-TLP/TLP/HMM/HBM calibration. Size: 24 mm x 24 mm. Probing pitch 50 µm to 3 mm.
The BT-101000B is used for DC biased TLP, VF-TLP, HMM or general RF measurements of high voltage and power devices in the time domain or frequency domain.