High Power Pulse Instruments GmbH – Advanced TLP/HMM/HBM Solutions

ATS-8000A Automated Test System

Fully automated test and probing solution for HBM, TLP, HMM and CC-TLP on package- and wafer-level.

Accurate Calibration

High performance wafer-level calibration substrate for accurate calibration of the VF-TLP/TLP/HMM/HBM system.

Flexible Pitch GND Fixture GF-A

High performance GND clamps for flex-pitch application

TLP-8010C Advanced

80A VF-TLP/TLP, 15kV HMM plus optional 6kV HBM (JEDEC) system. Optional pulse width extender TLP-3011C, TLP-8012A5

Accessories

Including all required accessories for VF-TLP/TLP/HMM/HBM

PS-5026B

Low Cost Portable Wafer Probe Station for TLP/VF-TLP/HMM/HBM

TLP-3010C

30A TLP/VF-TLP/HMM test system TLP-3010C: shown with optional pulse width extender TLP-3011C

6kV HBM Extension for TLP

80A VF-TLP/TLP + 15kV HMM + 6kV HBM (JEDEC)

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It's Not Only Hardware - Software and ESD Knowledge Makes the Difference!

320 mm Automated Test System ATS-8300G

The ATS-8300G test system is a 320 mm fully automated robotic probing solution for TLP, VF-TLP, HBM, HMM and CC-TLP on package- and wafer-level.

CC-TLP

HPPI is offering CC-TLP for investigation of CDM from Fraunhofer EMFT. The new CC-TLP probe CC-TLP-50-A1 is operated using the HPPI TLP-3010C/4010C/8010C/12010C systems and software.

What is TLP?

High Current TLP Characterisation: An Effective Tool for the Development of Semiconductor Devices and ESD Protection Solutions.

HP-T26A

High Performance TLP Probes for advanced VF-TLP/TLP on-wafer measurements.

PHD-4001A: High Performance VF-TLP/TLP/HMM Probearm Kit

Extremely compact and robust TLP/VF-TLP/HMM Picoprobe probearm kit for temperature measurements using coaxial cable tunnels for thermo-chuck in isolated chamber temperature measurements for 300 mm probe stations.

PHD-3001A-FS

GGB Picoprobe Model 10 pulse force and pulse sense probe including touch down force sensors and rotary stages for probe tip alignment.

TLP-16010C: 160 A High Voltage 50 Ω Pulse Generator

New range extension of TLP-xx10C systems up to 160 A and 43 kV HMM.

CCTLP-DC

CC-TLP Probing System with DC Test.

1 kV, 10 A, 4 GHz Bias Tee

The BT-101000B is used for DC biased TLP, VF-TLP, HMM or general RF measurements of high voltage and power devices in the time domain or frequency domain.

15 kV 50 Ω Coaxial Load Resistor

15 kV pulsed operation at 100 W average power. DC to 3.5 GHz (VSWR < 1.2).

30 ps Pulse Module

30 ps rise time pulse module for advanced VF-TLP and CC-TLP application at 500 ps pulse width.

30 ps Rise-Time Integrated Pulse Module including Pick-Off and DUT Switch

Integrated pick-off tee for TDR DUT current and voltage measurement. Integrated DUT-switch for DC test and Kelvin-type pulse sense DUT voltage measurement.

30-pin HBM Matrix Tester ANSI/ESDA/JEDEC JS-001

30 V to 10k V HBM matrix tester according ANSI/ESDA/JEDEC JS-001.

±6 kV Solid-State 2-Pin HBM Pulser

Solid-State ±30 V to ±6 kV Human-Body-Model (HBM) 2-pin tester according ANSI/ESDA/JEDEC JS-001 standard with C=100 pF, R=1.5 kΩ discharge network.

CS-0V5-A: 120 A in 150 ps

Pulse current sensor CS-0V5-A with very fast rise time 3 GHz bandwidth. Successor for Tek CT-1/2/6.

CAL-04A

New precision wafer-level calibration ceramic substrate for VF-TLP/TLP/HMM/HBM calibration. Size: 24 mm x 24 mm. Probing pitch 50 µm to 3 mm.