Introduction

Company Profile

High Power Pulse Instruments GmbH (HPPI) is a supplier of ESD measurement equipment based on advanced Transmission Line Pulse (TLP) techniques.

Our products enable the characterization of semiconductor devices and circuits in the pulsed high current and high voltage time domain.

The development of our systems has profited largely from the knowledge gained over 20 years in the development of semiconductor devices, integrated high speed and radio frequency circuits and ESD protection solutions for the semiconductor industry.

Our products combine standard TLP, very fast TLP and Human Metal Model (HMM) in a single test system to cover most of today’s ESD characterization needs.

Articles mentioning HPPI TLP equipment

N. Jack and E. Rosenbaum, “Comparison of FICDM and Wafer-level CDM Test Methods,” IEEE. Trans. Dev. Materials Rel., vol. 13, no. 2, pp. 379-387, 2013.

N. Jack and E. Rosenbaum, “Comparing FICDM and Wafer-Level CDM test methods: apples to oranges?,” EOS/ESD Symposium Proc., pp. 231-239, 2012.

R. Mertens and E. Rosenbaum, “A physics-based compact model for SCR devices used in ESD protection circuits,” Proc. IEEE Int. Rel. Phys. Symp., pp. 2B.2.1-2B.2.7, 2013.

R. Mertens and E. Rosenbaum, “Separating SCR and trigger circuit related overshoot in SCR-based ESD protection circuits,” EOS/ESD Symp. Proc., pp. 125-132, 2013.

K.-H. Meng and E. Rosenbaum, “Layout-aware, distributed, compact model for multi-finger MOSFETs operating under ESD conditions,” EOS/ESD Symp. Proc., pp. 97-104, 2013.

R. Mertens, N. Thomson, Y. Xiu and E. Rosenbaum, “Theory of Active Clamp Response to Power-On ESD and Implications for Power Supply Integrity,” 2014 EOS/ESD Symp.

N. Thomson, Y. Xiu, R. Mertens, M-S Keel and E. Rosenbaum, “Custom Test Chip for System-level ESD Investigations,” 2014 EOS/ESD Symp.

Y. Xiu, N. Thomson, R. Mertens and E. Rosenbaum, “A mechanism for logic upset induced by power-on ESD,” 2014 EOS/ESD Symp.

Z. Chen, R. Mertens C. Reiman and E. Rosenbaum, “Improved GGSCR layout for overshoot reduction,” 2015 Int. Reliability Physics Symp.

C. Reiman, N. Thomson, Y. Xiu, R. Mertens and E. Rosenbaum, “Practical methodology for the extraction of SEED models,” accepted for presentation at 2015 EOS/ESD Symp.