{"id":183,"date":"2013-06-05T21:40:47","date_gmt":"2013-06-05T21:40:47","guid":{"rendered":"http:\/\/www.hppi.de\/?page_id=183"},"modified":"2020-03-21T16:23:22","modified_gmt":"2020-03-21T16:23:22","slug":"management-team","status":"publish","type":"page","link":"https:\/\/www.hppi.de\/?page_id=183","title":{"rendered":"David Johnsson, Founder"},"content":{"rendered":"

Software and Hardware R&D<\/h2>\n

Measurement Techniques<\/h3>\n\n\n\n
2009<\/td>\n:<\/td>\nCo-founder of the High Power Pulse Instruments GmbH<\/td>\n<\/tr>\n
2006 – 2009<\/td>\n:<\/td>\nInfineon Automotive Power Semiconductor Division: research on system-level ESD in high voltage BCD technologies.<\/td>\n<\/tr>\n<\/table>\n

List of Publications<\/h3>\n

D. Johnsson, W. Mamanee, S. Bychikhin, D. Pogany, E. Gornik, and M. Stecher, \u201cSecond breakdown behavior in bipolar esd protection devices during low current long duration stress and its relation to moving current-tubes,\u201d in 2008 IEEE International Reliability Physics Symposium, Apr. 2008, pp. 240\u2013246. DOI: 10.1109\/RELPHY.2008.4558893.<\/p>\n

V. Issakov, D. Johnsson, Y. Cao, M. Tiebout, M. Mayerhofer, W. Simburger, and L. Maurer, \u201cEsd concept for high-frequency circuits,\u201d in EOS\/ESD 2008 – 2008 30th Electrical Overstress\/Electrostatic Discharge Symposium, Sep. 2008, pp. 221\u2013227.<\/p>\n

Y. Cao, W. Simburger, and D. Johnsson, \u201cRise-time filter design for transmission-line pulse measurement systems,\u201d in 2009 German Microwave Conference, Mar. 2009, pp. 1\u20135. DOI: 10.1109\/GEMIC.2009.4815848.<\/p>\n

D. Johnsson, M. Mayerhofer, J. Willemen, U. Glaser, D. Pogany, E. Gornik, and M. Stecher, \u201cAvalanche breakdown delay in high-voltage p-n junctions caused by pre-pulse voltage from iec 61000-4-2 esd generators,\u201d IEEE Transactions on Device and Materials Reliability, vol. 9, no. 3, pp. 412\u2013418, Sep. 2009, ISSN: 1558-2574. DOI: 10.1109\/TDMR.2009.2023513.<\/p>\n

D. Pogany, D. Johnsson, S. Bychikhin, K. Esmark, P. Rodin, E. Gornik, M. Stecher, and H. Gossner, \u201cNonlinear dynamics approach in modeling of the on-state-spreading – related voltage and current transients in 90nm cmos silicon controlled rectifiers,\u201d in 2009 IEEE International Electron Devices Meeting (IEDM), Dec. 2009, pp. 1\u20134. DOI: 10.1109\/IEDM.2009.5424308.<\/p>\n

Y. Cao, D. Johnsson, B. Arndt, and M. Stecher, \u201cA tlp-based human metal model esd-generator for device qualification according to iec 61000-4-2,\u201d in 2010 Asia-Pacific International Symposium on Electromagnetic Compatibility, Apr. 2010, pp. 471\u2013474. DOI: 10.1109\/APEMC.2010.5475621.<\/p>\n

D. Johnsson, D. Pogany, J. Willemen, E. Gornik, and M. Stecher, \u201cAvalanche breakdown delay in esd protection diodes,\u201d IEEE Transactions on Electron Devices, vol. 57, no. 10, pp. 2470\u20132476, Oct. 2010, ISSN: 1557-9646. DOI: 10.1109\/TED.2010.2058790.<\/p>\n

J. Willemen, D. Johnsson, Y. Cao, and M. Stecher, \u201cA tlp-based characterization method for transient gate biasing of mos devices in high-voltage technologies,\u201d in Electrical Overstress\/Electrostatic Discharge Symposium Proceedings 2010, Oct. 2010, pp. 1\u201310.<\/p>\n

D. Pogany, D. Johnsson, S. Bychikhin, K. Esmark, P. Rodin, M. Stecher, E. Gornik, and H. Gossner, \u201cMeasuring holding voltage related to homogeneous current flow in wide esd protection structures using multilevel tlp,\u201d IEEE Transactions on Electron Devices, vol. 58, no. 2, pp. 411\u2013418, Feb. 2011, ISSN: 1557-9646. DOI: 10.1109\/TED.2010.2093143.<\/p>\n

D. Johnsson and H. Gossner, \u201cStudy of system esd codesign of a realistic mobile board,\u201d in EOS\/ESD Symposium Proceedings, Sep. 2011, pp. 1\u201310.<\/p>\n

W. Mamanee, S. Bychikhin, D. Johnsson, N. Jensen, M. Stecher, E. Gornik, and D. Pogany, \u201cEffect of elevated ambient temperature on thermal breakdown behavior in bcd esd protection devices subjected to long electrical overstress pulses,\u201d IEEE Transactions on Device and Materials Reliability, vol. 12, no. 3, pp. 562\u2013569, Sep. 2012, ISSN: 1558-2574. DOI: 10.1109\/TDMR.2012.2193884.<\/p>\n

H. Li, C. C. Russ, W. Liu, D. Johnsson, H. Gossner, and K. Banerjee, \u201cEsd characterization of atomically-thin graphene,\u201d in Electrical Overstress \/ Electrostatic Discharge Symposium Proceedings 2012, Sep. 2012, pp. 1\u20138.<\/p>\n

\u2014\u2014, \u201cOn the electrostatic discharge robustness of graphene,\u201d IEEE Transactions on Electron Devices, vol. 61, no. 6, pp. 1920\u20131928, Jun. 2014, ISSN: 1557-9646. DOI: 10.1109\/TED.2014.2315235.<\/p>\n

B. Orr, D. Johnsson, K. Domanski, H. Gossner, and D. Pommerenke, \u201cA passive coupling circuit for injecting tlp-like stress pulses into only one end of a driver\/receiver system,\u201d in 2015 37th Electrical Overstress\/Electrostatic Discharge Symposium (EOS\/ESD), Sep. 2015, pp. 1\u20138. DOI: 10.1109\/EOSESD.2015.7314800.<\/p>\n

D. Johnsson, K. Domanski, and H. Gossner, \u201cDevice failure from the initial current step of a cdm discharge,\u201d in 2018 40th Electrical Overstress\/Electrostatic Discharge Symposium (EOS\/ESD), Sep. 2018, pp. 1\u20137. DOI: 10.23919\/EOS\/ESD.2018.8509779.<\/p>\n","protected":false},"excerpt":{"rendered":"

Software and Hardware R&D Measurement Techniques 2009 : Co-founder of the High Power Pulse Instruments GmbH 2006 – 2009 : Infineon Automotive Power Semiconductor Division: research on system-level ESD in Continue Reading \u2192<\/a><\/p>\n","protected":false},"author":1,"featured_media":0,"parent":15,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-183","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/www.hppi.de\/index.php?rest_route=\/wp\/v2\/pages\/183","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.hppi.de\/index.php?rest_route=\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.hppi.de\/index.php?rest_route=\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.hppi.de\/index.php?rest_route=\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.hppi.de\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=183"}],"version-history":[{"count":26,"href":"https:\/\/www.hppi.de\/index.php?rest_route=\/wp\/v2\/pages\/183\/revisions"}],"predecessor-version":[{"id":1909,"href":"https:\/\/www.hppi.de\/index.php?rest_route=\/wp\/v2\/pages\/183\/revisions\/1909"}],"up":[{"embeddable":true,"href":"https:\/\/www.hppi.de\/index.php?rest_route=\/wp\/v2\/pages\/15"}],"wp:attachment":[{"href":"https:\/\/www.hppi.de\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=183"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}