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High Power Pulse Instruments GmbH
Advanced TLP/HMM Solutions

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HPPI GmbH 2011. All rights reserved.
TLP/VF-TLP/HMM Test System TLP-3010C/3011C

Pulse System TLP-3010C/3011C for the following applications fields:

  • ESD robustness characterization on wafer-, chip- and board-level by TLP/vf-TLP/HMM pulse types
  • Safe-Operating-Area (SOA) measurements of active and passive devices from 1 ns to 1.6 µs pulse width
  • Reverse and forward recovery measurements of diodes from 200 ps to 1 µs
  • Breakdown and turn on/off characteristics of devices
  • Measurement of the impulse response

Features of the System

  • Wafer and system level TLP/VF-TLP/HMM test system
  • Ultra fast 50 Ω pulse output with 100 ps rise time
  • Built-in HMM (IEC 61000-4-2) pulse up to ±8 kV
  • High pulse output current up to ±30 A
  • 6 programmable pulse rise-times: 100 ps to 45 ns
  • 8 programmable pulse widths: 1 ns to 100 ns
  • Optional pulse width extender increases pulse width up to 1.6 µs in 68 GPIB programmable steps
  • Fast measurement time, typically 0.5 s per pulse including one-point DC measurement between pulses
  • Efficient MATLAB®-based software (optional open source) for system control and waveform data management

Download:  Product Datasheet TLP-3010C/3011C

Portable Wafer Probe Station PS-5026A

Features of the System

  • Portable manual wafer probe station
  • Electrically isolated chuck with vacuum interface and wafer backside potential connector
  • 80x trinocular stereo zoom microscope
  • Ultra long-life 20000 lx white LED ring light
  • High reliability
  • Low cost

Download:  Product Datasheet PS-5026A

Precision Micromanipulator Kit for TLP/VF-TLP Wafer-Level Measurements
PHD-3001A

Features of the System

  • Pulse force and pulse sense RF probing solution for TLP/VF-TLP/HMM on-wafer measurements
  • High peak current capability >50 A (30 ns)
  • DC - 7 GHz bandwidth
  • Isolated probe-head ground shield for high pulse sense common mode signal rejection
  • True coaxial high-resolution 80:1 rotary probe-head for accurate probe tip adjustment


Download:  Product Datasheet PHD-3001A