Application Notes

TLP Software and Manuals

Please contact HPPI to download the latest release of the TLP software and manuals: info@hppi.de

Technical Reports and Application Notes

Title Download
High Current TLP Characterisation:
An effective tool for the development of semiconductor devices and ESD protection solutions
PDF
Measurement Report: TLP-3010C VF-TLP waveforms PDF
Application Note AN-010: How to use picoprobes and flexible pitch probes – This application note describes the four point Kelvin standard TLP method using discrete current sensor, fixed pitch and variable pitch wafer level probe tips. Another question “Why the current sensor should be connected to the DUT as close as possible?” is discussed in this application note. PDF
Application Note AN-011: Picoprobe Model 10 – Frequency Response PDF